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Last edited by LC Bot
February 15, 2012 | History
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Rajeshuni Ramesham

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11 works Add another?

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  • Cover of: Reliability, testing, and characterization of MEMS/MOEMS III: 26-28 January, 2004, San Jose, California, USA

    First published in 2004 2 editions in 1 language — 1 previewable
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  • Cover of: Reliability, packaging, testing, and characterization of MEMS/MOEMS IV: 24-25 January 2005, San Jose, California, USA

    First published in 2005 1 edition in 1 language — 1 previewable
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  • Cover of: MEMS reliability for critical and space applications: 21-22 September, 1999, Santa Clara, California

    First published in 1999 1 edition in 1 language — 1 previewable
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  • Cover of: Reliability, testing, and characterization of MEMS/MOEMS: 22-24 October 2001, San Francisco, USA

    First published in 2001 1 edition in 1 language — 1 previewable
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  • Cover of: Reliability, testing, and characterization of MEMS/MOEMS II: 27-29 January 2003, San Jose, California, USA

    First published in 2003 1 edition in 1 language — 1 previewable
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  • Cover of: Reliability, Packaging, Testing and Characterization of Mems / Moems 5 (Proceedings of Spie)

    First published in 2006 1 edition in 1 language
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  • Cover of: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII: 28-29 January 2009, San Jose, California, United States

    First published in 2009 1 edition in 1 language
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  • Cover of: Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII

    First published in 2014 1 edition in 1 language
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  • Cover of: Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices IX: 25-26 January 2010, San Francisco, California, United States

    First published in 2010 1 edition in 1 language
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  • Cover of: Reliability, packaging, testing, and characterization of MEMS/MOEMS VI: 23-24 January, 2007, San Jose, California, USA

    First published in 2007 1 edition in 1 language
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  • Cover of: Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI: 23-24 January 2012, San Francisco, California, United States

    First published in 2012 1 edition in 1 language
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We need a photo of Rajeshuni Ramesham

Subjects
Congresses, Microelectromechanical systems, Reliability, Testing, Microelectronic packaging, Electromechanical devices, Microelectronics, Electronic packaging, Optoelectronic devices

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ID Numbers

  • OLID: OL7079303A

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History

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February 15, 2012 Created by LC Bot import new book