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Last edited by RenameBot
September 7, 2008 | History
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John R. Devaney

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  • Cover of: Failure analysis mechanisms techniques & photo atlas: a guide to the performance and understanding of failure analysis

    First published in 1983 — 1 edition
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  • Cover of: Notes on SEM examination of microelectronic devices

    First published in 1977 — 1 edition
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Subjects

Miniature electronic equipment, Scanning electron microscopes, Scanning electron microscopy, Semiconductors, System failures, System failures (Engineering), Technique, Testing

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ID Numbers

  • OLID: OL1382504A

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History

Download catalog record: RDF / JSON
September 7, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import