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IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)

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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

by IEEE International Workshop on Defect Ba..., Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, and Quebec) IEEE VLSI Test Symposium (2000 :... First published in 2000 — 2 editions

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Created April 1, 2008
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