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Last edited anonymously
April 29, 2008 | History
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Vishwani D. Agrawal

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  • Cover of: Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

    First published in 2000 — 2 editions
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Subjects

Digital integrated circuits, Electronic Measurements, Electronic devices & materials, Electronics - Circuits - General, Electronics - Circuits - VLSI, Engineering - Electrical & Electronic, General, General Theory of Computing, Integrated circuits, Integrated circuits, very large scale integration, Mixed signal circuits, Science/Mathematics, Semiconductor storage devices, Technology, Technology & Industrial Arts, Technology / Electronics / Circuits / General, Testing, Textbooks, Very large scale integration, Very-Large-Scale Integration (Vlsi)

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ID Numbers

  • OLID: OL2785111A

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April 29, 2008 Created by an anonymous user initial import