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Last edited anonymously
April 29, 2008 | History

Adam Osseiran

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  • Cover of: Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149. 4 Test Standard

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  • Cover of: VLSI-SoC : from Systems to Silicon: IFIP TC10/ WG 10. 5 Thirteenth International Conference on Very Large Scale Integration of System on Chip , October 17-19, 2005, Perth, Australia

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  • Cover of: Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

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April 29, 2008 Created by an anonymous user initial import