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Last edited anonymously
April 30, 2008 | History
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S. Amelinckx

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13 works Add another?

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  • Cover of: Applications, Volume 3, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry

    First published in 1996 7 editions in 1 language — 1 previewable
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  • Cover of: Electron Microscopy: Principles and Fundamentals

    First published in 1997 4 editions in 1 language
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  • Cover of: The direct observation of dislocations

    First published in 1964 2 editions
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  • Cover of: 3 Volume Set, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry

    First published in 1996 2 editions in 2 languages — 1 previewable
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  • Cover of: Diffraction and Imaging Techniques in Material Science P1: Electron Microscopy

    First published in 2012 1 edition in 1 language
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  • Cover of: Diffraction and Imaging Techniques in Material Science P2: Imaging and Diffraction Techniques

    First published in 2012 1 edition in 1 language
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  • Cover of: Thermodynamics of Point Defects and Their Relation with Bulk Properties

    First published in 2013 1 edition in 1 language
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  • Cover of: Diffraction and imaging techniques in material science

    First published in 1978 1 edition in 1 language
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  • Cover of: Handbook of Microscopy Vol. 1: Applications in Materials Science, Solid-State Physics, and Chemistry, Methods I

    First published in 2008 1 edition in 1 language
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  • Cover of: Handbook of Microscopy Vol. 1, 2 and 3: Applications in Materials Science, Solid-State Physics and Chemistry

    First published in 2008 1 edition in 1 language
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  • Cover of: direct observation of dislocations.

    First published in 1964 1 edition in 1 language
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  • Cover of: Handbook of Microscopy: Methods II

    First published in 1996 1 edition in 1 language — 1 previewable
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  • Cover of: Solid state dosimetry

    First published in 1969 1 edition in 1 language
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We need a photo of S. Amelinckx

Subjects
Congresses, Electron microscopy, Materials, Microscopy, Microscopy, technique, Diffraction, Dislocations in crystals, Electron microscopes, Electrons, Imaging systems, Materials, microscopy, Radiation dosimetry, Solids

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ID Numbers

  • OLID: OL3176870A

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History

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April 30, 2008 Created by an anonymous user initial import