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Last edited anonymously
April 30, 2008 | History
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Optonet

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  • Cover of: Advances in Optical Thin Films II: 13-15 September 2005, Jena, Germany (SPIE Conference Proceedings)

    First published in 2005 — 1 edition
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  • Cover of: Optical Fabrication, Testing and Metrology II: 13-15 September 2005, Jena, Germany (SPIE Conference Proceedings)

    First published in 2005 — 1 edition
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We need a photo of Optonet

Subjects

Congresses, Design and construction, Measurement, Metrology, Optical coatings, Optical films, Optical instruments, Optical materials, Optical properties, Testing, Thin films

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ID Numbers

  • OLID: OL3617986A

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History

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April 30, 2008 Created by an anonymous user initial import