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Last edited anonymously
April 30, 2008 | History
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Kevin G. Harding

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  • Cover of: Machine vision and three-dimensional imaging systems for inspection and metrology: 6-8 November 2001 [i.e. 2000], Boston, USA

    First published in 2001 — 1 edition
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  • Cover of: Industrial optical sensors for metrology and inspection: 31 October-1 November 1994, Boston, Massachusetts

    First published in 1995 — 1 edition
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  • Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection III: 14-15 October, 1997, Pittsburgh, Pennsylvania

    First published in 1997 — 1 edition
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  • Cover of: Three-dimensional imaging, optical metrology, and inspection V: 19-20 September 1999, Boston, Massachusetts

    First published in 1999 — 1 edition
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  • Cover of: Three-dimensional imaging, optical metrology, and inspection IV: 2-3 November, 1998, Boston, Massachusetts

    First published in 1998 — 1 edition
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  • Cover of: Industrial applications of optical inspection, metrology, and sensing: 19-20 November 1992, Boston, Massachusetts

    First published in 1993 — 1 edition
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  • Cover of: Industrial optical sensing and metrology: applications and integration : 10 September 1993, Boston, Massachusetts

    First published in 1993 — 1 edition
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  • Cover of: Three-dimensional imaging and laser-based systems for metrology and inspection II: 20-21 November, 1996, Boston, Massachusetts

    First published in 1996 — 1 edition
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  • Cover of: Optomechanical and electro-optical design of industrial systems: 28-29 June 1988, Dearborn, Michigan

    First published in 1988 — 1 edition
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We need a photo of Kevin G. Harding

Subjects

Congresses, Measurement, Engineering inspection, Industrial applications, Three-dimensional display systems, Lasers, Optical measurements, Optical methods, Quality control, Computer vision, Mensuration, Optical detectors, Triangulation, Imaging systems, Optical instruments, Electrooptical devices, Image processing, digital techniques, Interferometry, Measuring instruments, Metrology, Moire topography, Optics, Speckle metrology, Three-dimensional imaging

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ID Numbers

  • OLID: OL3617991A

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History

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April 30, 2008 Created by an anonymous user initial import