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Last edited anonymously
April 30, 2008 | History
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Klaus Wetzig

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4 works Add another?

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  • Cover of: Metal Based Thin Films for Electronics

    First published in 2005 — 4 editions
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  • Cover of: Metal based thin films for electronics

    First published in 2003 — 1 edition
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  • Cover of: In Situ Scanning Electron Microscopy in Materials Research

    First published in 1995 — 1 edition
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  • Cover of: Ion Beams In Materials Processing And Analysis

    First published in 2012 — 1 edition
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Subjects

Materials, Electronics, Metallic films, Thin films, Analysis, Electron microscopes, Industrial applications, Instrumentation Electronics and Microelectronics, Ion bombardment, Ion implantation, Materials science, Materials, effect of radiation on, Materials, testing, Microscopy, Optical and Electronic Materials, Optical materials, Particle and Nuclear Physics, Scanning electron microscopy, Testing

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ID Numbers

  • OLID: OL3982516A

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History

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April 30, 2008 Created by an anonymous user initial import