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April 1, 2008 | History
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IEEE International Workshop on IDDQ Testing (3rd 1997 Washington, D.C.)

We need a photo of IEEE International Workshop on IDDQ Testing (3rd 1997 Washington, D.C.)

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  • Cover of: IEEE International Workshop on IDDQ Testing: Digest of papers, November 5-6, 1997, Washington, D.C

    First published in 1997 — 3 editions
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We need a photo of IEEE International Workshop on IDDQ Testing (3rd 1997 Washington, D.C.)

Subjects

Complementary Metal oxide semiconductors, Computer Engineering, Computers, Congresses, Digital Computer Hardware, General, General Theory of Computing, Iddq testing, Logic Design, Metal oxide semiconductors, Co, Metal oxide semiconductors, Complementary, Science/Mathematics, Storage media & peripherals, Technology & Industrial Arts, Testing

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  • OLID: OL407452A

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April 1, 2008 Created by an anonymous user initial import