It looks like you're offline.
Open Library logo
additional options menu
Last edited by RenameBot
August 31, 2008 | History

John C. Stover

We need a photo of John C. Stover

9 works Add another?

Showing all works by author. Would you like to see only ebooks?

  • Cover of: Surface Characterization for Computer Disc Wafers: 28 January 1999, San Jose, California (Proceedings of Spie--the International Society for Optical Engineering, 3619.)

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Optical scattering: applications, measurement, and theory II : 15-16 July 1993, San Diego, California

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Optical Scattering: Measurement and Analysis (Optical and Electro-Optical Engineering Series)

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Optical scattering: measurements and analysis

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Optical scattering in the optics, semiconductor, and computer disk industries: 13-14 July 1995, San Diego, California

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Optical scatter: applications, measurement, and theory : 24-26 July 1991, San Diego, California

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II: 29-30 January 1998, San Jose, California

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays: 8-9 August 1996, Denver, Colorado

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Scatter from optical components: 8-10 August 1989, San Diego, California

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today

History

Download catalog record: RDF / JSON
August 31, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import