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Last edited by LC Bot
October 22, 2011 | History
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Joanna Schmit

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9 works Add another?

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  • Cover of: Interferometry 13: Techniques and Analysis (Proceedings of SPIE)

    First published in 2006 — 2 editions
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  • Cover of: The optics encyclopedia: basic foundations and practical applications

    First published in 2004 — 1 edition
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  • Cover of: Interferometry XI: techniques and analysis, 8-10 July 2002, Seattle USA

    First published in 2002 — 1 edition
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  • Cover of: Interferometry XIV - Techniques and Analysis: 11-13 August 2008, San Diego, California, USA

    First published in 2008 — 1 edition
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  • Cover of: Interferometry XVI: Techniques and Analysis

    First published in 2012 — 1 edition
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  • Cover of: Interferometry XVII: Techniques and Analysis

    First published in 2014 — 1 edition
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  • Cover of: Optics Encyclopedia: Basic Foundations and Practical Applications

    First published in 2007 — 1 edition
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  • Cover of: Interferometry XV: Techniques and analysis : 2-4 August 2010, San Diego, California, United States

    First published in 2010 — 1 edition
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  • Cover of: Interferometry XIII

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We need a photo of Joanna Schmit

Subjects

Interferometry, Measurement, Metrology, Congresses, Methodology, Optics, Encyclopedias, Encyclopédies, Industrial applications, Optique

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ID Numbers

  • OLID: OL6992321A

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History

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October 22, 2011 Created by LC Bot import new book