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Last edited by LC Bot
January 25, 2012 | History

Alexander A. Demkov

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  • Cover of: Integration of Functional Oxides with Semiconductors

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  • Cover of: Materials Fundamentals of Gate Dielectrics

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  • Cover of: CMOS gate-stack scaling-- materials, interfaces and reliability implications: symposium held April 14-16, 2009, San Francisco, california, U.S.A.

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  • Cover of: Materials Fundamentals of Gate Dielectrics

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  • Cover of: CMOS Gate-Stack Scaling Vol. 1155: Materials, Interfaces and Reliability Implications

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