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Institute for Applied Technology (U.S.). Electronic Technology Division

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Semiconductor measurement technology: Permanent Damage Effects Of Nuclear Radiation On The X Band Performance Of Silicon Schottky Barrier Microwave Mixer Diodes

by Kenney, James M. and Institute for Applied Technology (U.S.)... First published in 1976 1 edition in 1 language — 1 previewable

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Created December 10, 2015
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December 10, 2015

Created by ww2archive

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