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Last edited by Mek
October 14, 2016 | History
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C. K. Maiti

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  • Cover of: Strainengineered Mosfets

    First published in 2012 — 1 edition
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Subjects

Circuits intégrés, Contraintes (Mécanique), Electronics, Engineering, Fault tolerance, Fiabilité, Integrated circuits, Metal oxide semiconductor field-effect transistors, Reliability, Strain, Strains and stresses, Stress, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Microelectronics, TECHNOLOGY & ENGINEERING / Material Science, Tolérance aux fautes, Transistors MOSFET

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ID Numbers

  • OLID: OL7323909A

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History

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October 14, 2016 Created by Mek Added new book.