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Process control, Integrated circuits, Congresses, MeasurementShowing 1 featured edition. View all 1 editions?
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Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California (Proceedings of S P I E)
May 1992, SPIE-International Society for Optical Engine
Paperback
in English
081940828X 9780819408280
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- Created April 30, 2008
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July 21, 2024 | Edited by MARC Bot | import existing book |
October 7, 2020 | Edited by ImportBot | import existing book |
July 31, 2020 | Edited by ImportBot | import existing book |
April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
April 30, 2008 | Created by an anonymous user | Imported from amazon.com record |