Electronic characterization of defects in narrow gap semiconductors

final report, November 25, 1992 to November 25, 1994

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Electronic characterization of defects in nar ...
James D. Patterson
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Last edited by VacuumBot
June 5, 2012 | History

Electronic characterization of defects in narrow gap semiconductors

final report, November 25, 1992 to November 25, 1994

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Cover of: Electronic characterization of defects in narrow gap semiconductors
Cover of: Electronic characterization of defects in narrow gap semiconductors
Electronic characterization of defects in narrow gap semiconductors: final report, November 25, 1992 to November 25, 1994
1994, [National Aeronautics and Space Administration], George C. Marshall Space Flight Center, National Technical Information Service, distributor
Microform in English

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Book Details


Edition Notes

Distributed to depository libraries in microfiche.

Shipping list no.: 95-0270-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 2 microfiches.

Published in
Marshall Space Flight Center, AL, [Springfield, Va
Series
NASA contractor report -- NASA CR-197217.

The Physical Object

Format
Microform
Pagination
1 v.

ID Numbers

Open Library
OL15410047M

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
June 5, 2012 Edited by VacuumBot Updated format '[microform]' to 'Microform'
December 15, 2009 Edited by WorkBot link works
September 19, 2008 Created by ImportBot Imported from Oregon Libraries MARC record