An edition of A simple method of obtaining concentration depth-profiles from X-ray diffraction (1984)

A simple method of obtaining concentration depth-profiles from X-ray diffraction

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A simple method of obtaining concentration de ...
Karl E. Wiedemann
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Last edited by VacuumBot
August 9, 2012 | History
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An edition of A simple method of obtaining concentration depth-profiles from X-ray diffraction (1984)

A simple method of obtaining concentration depth-profiles from X-ray diffraction

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Publish Date
Publisher
Metallurgical Society of AIME, National Aeronautics and Space Administration, National Technical Information Service, distributor
Language
English

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Subjects

Convolution integrals, Diffraction patterns, X ray diffraction, Luminous intensity, Depth measurement

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Edition Availability
Cover of: A simple method of obtaining concentration depth-profiles from X-ray diffraction
A simple method of obtaining concentration depth-profiles from X-ray diffraction
1984, Metallurgical Society of AIME, National Aeronautics and Space Administration, National Technical Information Service, distributor
Microform in English
  • Not in Library

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Book Details

Edition Notes

Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1986] 1 microfiche.

Published in
Warrendale, PA, [Washington, DC, Springfield, Va
Series
NASA contractor report -- NASA CR-176262., TMS paper selection -- paper no. F84-15.

The Physical Object

Format
Microform
Pagination
1 v.

ID Numbers

Open Library
OL15417467M

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 9, 2012 Edited by VacuumBot Updated format '[microform] /' to 'Microform'; Removed author from Edition (author found in Work)
December 15, 2009 Edited by WorkBot link works
September 19, 2008 Created by ImportBot Imported from Oregon Libraries MARC record