Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
Subjects
Complementary Metal oxide semiconductors, Digital integrated circuits, Electric leakage, Prevention, Circuits & components, Science/Mathematics, Electronics - Circuits - General, Computers - General Information, Technology, Metal oxide semiconductors, Complementary, Engineering - Electrical & Electronic, CAD-CAM - General, Computer Engineering, Technology / Electronics / Circuits / General, Metal oxide semiconductors, Co, Metal oxide semiconductors, complementaryShowing 4 featured editions. View all 4 editions?
Edition | Availability |
---|---|
1
Multi-Threshold CMOS Digital Circuits: Managing Leakage Power
Mar 19, 2012, Springer
paperback
1461503922 9781461503927
|
zzzz
Libraries near you:
WorldCat
|
2
Multi-threshold CMOS digital circuits: managing leakage power
2004, Kluwer Academic Publishers
in English
1402075294 9781402075292
|
zzzz
Libraries near you:
WorldCat
|
3
Multi-threshold CMOS digital circuits: managing leakage power
2003, Kluwer Academic Publishers
in English
1402075294 9781402075292
|
aaaa
Libraries near you:
WorldCat
|
4
Multi-Threshold CMOS Digital Circuits: Managing Leakage Power
October 31, 2003, Springer
Hardcover
in English
- 1 edition
1402075294 9781402075292
|
zzzz
Libraries near you:
WorldCat
|
Book Details
Edition Notes
Includes bibliographical references (p. [213]-214) and index
Classifications
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?History
- Created September 27, 2008
- 7 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
January 7, 2023 | Edited by MARC Bot | import existing book |
February 25, 2022 | Edited by ImportBot | import existing book |
December 8, 2020 | Edited by MARC Bot | import existing book |
April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
September 27, 2008 | Created by ImportBot | Imported from Miami University of Ohio MARC record |