VLSI test principles and architectures

design for testability

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Last edited by ImportBot
April 14, 2023 | History

VLSI test principles and architectures

design for testability

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  • 0 Currently reading
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Publish Date
Language
English
Pages
777

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Previews available in: English

Edition Availability
Cover of: VLSI test principles and architectures
VLSI test principles and architectures: design for testability
2006, Elsevier Morgan Kaufmann Publishers, Morgan Kaufmann
in English
Cover of: VLSI Test Principles and Architectures
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
July 7, 2006, Morgan Kaufmann
in English
Cover of: VLSI Test Principles and Architectures
VLSI Test Principles and Architectures: Design for Testability
2006, Elsevier Science & Technology Books
in English

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Book Details


Edition Notes

Includes bibliographical references and index

Published in
Amsterdam, Boston
Series
The Morgan Kaufmann series in systems on silicon

Classifications

Library of Congress
TK7874.75 .V587 2006, TK7874.75.V587 2006

The Physical Object

Pagination
xxx, 777 p. :
Number of pages
777

ID Numbers

Open Library
OL17200223M
Internet Archive
vlsitestprincipl00wang_005
ISBN 10
0123705975
LCCN
2006006869
OCLC/WorldCat
64624834, 434023516
Library Thing
8722884
Goodreads
941344

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
April 14, 2023 Edited by ImportBot import existing book
January 1, 2023 Edited by MARC Bot import existing book
December 30, 2022 Edited by MARC Bot import existing book
December 14, 2020 Edited by MARC Bot import existing book
September 27, 2008 Created by ImportBot Imported from Miami University of Ohio MARC record