An edition of Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques (1979)

Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.

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Nondestructive tests used to insure the integ ...
George G. Harman, George G. Ha ...
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Last edited by WorkBot
December 15, 2009 | History
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An edition of Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques (1979)

Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.

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Publish Date
Publisher
U.S. Government Printing Office
Language
English

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Subjects

Acoustic emission testing, Semiconductor industry, Nondestructive testing, Semiconductors, Testing, Quality control, Acoustic emission

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Edition Availability
Cover of: Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques.
1979, U.S. Government Printing Office
in English
  • Not in Library
Cover of: Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques
Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques
1979, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
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Book Details

Edition Notes

Published in
Washington
Series
NBS special publications -- 400-59, Semiconductor measurement technology

ID Numbers

Open Library
OL18887536M

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December 15, 2009 Edited by WorkBot link works
October 20, 2008 Created by ImportBot Imported from Talis record