An edition of Scanning microscopy 2010 (2010)

Scanning microscopy 2010

17-19 May 2010, Monterey, California, United States

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Scanning microscopy 2010
Michael T. Postek
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Last edited by MARC Bot
September 24, 2020 | History
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An edition of Scanning microscopy 2010 (2010)

Scanning microscopy 2010

17-19 May 2010, Monterey, California, United States

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English

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Subjects
Congresses, Scanning electron microscopes

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Edition Availability
Cover of: Scanning microscopy 2010
Scanning microscopy 2010: 17-19 May 2010, Monterey, California, United States
2010, SPIE
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 7729, Proceedings of SPIE--the International Society for Optical Engineering -- v. 7729.

Classifications

Dewey Decimal Class
570.28/25
Library of Congress
QH212.S3 .S345 2010, QH212.S3 S345 2010

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL24883248M
ISBN 10
081948217X
ISBN 13
9780819482174
LCCN
2010459471
OCLC/WorldCat
656784720

Source records

Library of Congress MARC record
Library of Congress MARC record
Library of Congress MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
September 24, 2020 Edited by MARC Bot import existing book
March 15, 2012 Edited by LC Bot import new book
July 29, 2011 Created by LC Bot Imported from Library of Congress MARC record