An edition of Scanning electron microscopy (1985)

Scanning electron microscopy

physics of image formation and microanalysis

by

Cover of: Scanning electron microscopy by Ludwig Reimer, Ludwig Reimer
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Last edited by ImportBot
January 15, 2023 | History
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An edition of Scanning electron microscopy (1985)

Scanning electron microscopy

physics of image formation and microanalysis

by

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer-Verlag
Language
English
Pages
457

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Previews available in: English

Subjects

Scanning electron microscopy, Microscopy, Electron, Scanning, Rasterelektronenmikroskopie, Microscopie électronique à balayage, Microanalyse par émission X., Scanning Electron microscope, Scanning electron microscopes

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Edition Availability
Cover of: Scanning electron microscopy
Scanning electron microscopy: physics of image formation and microanalysis
1998, Springer
in English - 2nd completely rev. and updated ed.
Libraries near you: WorldCat
Cover of: Scanning Electron Microscopy
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
January 1986, Springer
in English
Libraries near you: WorldCat
Cover of: Scanning electron microscopy
Scanning electron microscopy: physics of image formation and microanalysis
1985, Springer-Verlag
in English
Libraries near you: WorldCat

Add another edition?

Book Details

Edition Notes

Bibliography: p. [405]-446.
Includes index.

Published in
Berlin, New York
Series
Springer series in optical sciences ;, v. 45

Classifications

Dewey Decimal Class
535/.3325
Library of Congress
QH212.S3 R452 1985

The Physical Object

Pagination
xviii, 457 p. :
Number of pages
457

ID Numbers

Open Library
OL2531977M
Internet Archive
scanningelectron0000reim_t3l4
ISBN 10
0387135308
LCCN
85012627
OCLC/WorldCat
12161070
Library Thing
6275679
Goodreads
5505790

Source records

Library of Congress MARC record
Internet Archive item record
marc_columbia MARC record
Promise Item

First Sentence

"Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28]."

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
January 15, 2023 Edited by ImportBot import existing book
December 11, 2022 Edited by MARC Bot import existing book
July 26, 2021 Edited by ImportBot import existing book
November 2, 2020 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record