An edition of IDDQ Testing of VLSI Circuits (1993)

IDDQ Testing of VLSI Circuits

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Last edited by ImportBot
February 27, 2022 | History
An edition of IDDQ Testing of VLSI Circuits (1993)

IDDQ Testing of VLSI Circuits

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Publish Date
Publisher
Springer US
Language
English
Pages
124

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Previews available in: English

Edition Availability
Cover of: IDDQ Testing of VLSI Circuits
IDDQ Testing of VLSI Circuits
1993, Springer US
electronic resource / in English

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Book Details


Edition Notes

Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.

Published in
Boston, MA

Classifications

Dewey Decimal Class
620.00420285
Library of Congress
TA345-345.5, QA75.5-76.95

The Physical Object

Format
[electronic resource] /
Pagination
1 online resource (iv, 124 p.)
Number of pages
124

ID Numbers

Open Library
OL27064754M
Internet Archive
isubclassapluspl00sode
ISBN 10
1461363772, 1461531462
ISBN 13
9781461363774, 9781461531463
OCLC/WorldCat
852788274

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
February 27, 2022 Edited by ImportBot import existing book
February 26, 2022 Edited by ImportBot import existing book
July 4, 2019 Created by MARC Bot Imported from Internet Archive item record