Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
Subjects
Microscopy, Scanning probe microscopy, ElectrostaticsShowing 4 featured editions. View all 4 editions?
Edition | Availability |
---|---|
1
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Jan 04, 2019, Springer
paperback
3030092984 9783030092986
|
zzzz
Libraries near you:
WorldCat
|
2
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Mar 19, 2018, Springer
hardcover
3319756869 9783319756868
|
zzzz
Libraries near you:
WorldCat
|
3
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Nov 30, 2013, Springer
paperback
3642271138 9783642271137
|
aaaa
Libraries near you:
WorldCat
|
4
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
2011, Springer
in English
3642225667 9783642225666
|
zzzz
Libraries near you:
WorldCat
|
Book Details
Edition Notes
Source title: Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences (48))
Classifications
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?History
- Created June 30, 2020
- 3 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
October 10, 2020 | Edited by ImportBot | import existing book |
August 3, 2020 | Edited by ImportBot | import existing book |
June 30, 2020 | Created by ImportBot | Imported from amazon.com record |