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Subjects
Microscopy, Scanning probe microscopy, ElectrostaticsEdition | Availability |
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1
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Jan 04, 2019, Springer
paperback
3030092984 9783030092986
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2
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Mar 19, 2018, Springer
hardcover
3319756869 9783319756868
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WorldCat
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3
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Nov 30, 2013, Springer
paperback
3642271138 9783642271137
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aaaa
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WorldCat
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4
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
2011, Springer
in English
3642225667 9783642225666
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Book Details
Edition Notes
Source title: Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences (48))
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- Created June 30, 2020
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October 10, 2020 | Edited by ImportBot | import existing book |
August 3, 2020 | Edited by ImportBot | import existing book |
June 30, 2020 | Created by ImportBot | Imported from amazon.com record |