An edition of Advances in Metrology for X-Ray and EUV Optics II (2007)

Advances in Metrology for X-Ray and EUV Optics II

30 August 2007, San Diego, California, USA

by , , and

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Advances in Metrology for X-Ray and EUV Optic ...
Lahsen Assoufid, Peter Takacs, ...
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Last edited by MARC Bot
May 28, 2023 | History
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An edition of Advances in Metrology for X-Ray and EUV Optics II (2007)

Advances in Metrology for X-Ray and EUV Optics II

30 August 2007, San Diego, California, USA

by , , and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
SPIE
Language
English
Pages
168

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Subjects
Optical measurements, Measuring instruments, Interferometers, Measurement, Congresses, Optical instruments, Design and construction, Laser interferometers

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Edition Availability
Cover of: Advances in Metrology for X-Ray and EUV Optics II
Advances in Metrology for X-Ray and EUV Optics II: 30 August 2007, San Diego, California, USA
2007, SPIE
in English
  • Not in Library
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Book Details

Classifications

Library of Congress
QC367.A335 2007, QC367 .A335 2007, QC367 .A338 2007

ID Numbers

Open Library
OL28445089M
ISBN 13
9780819468529
LCCN
2009281699
OCLC/WorldCat
182860020

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Library of Congress MARC record
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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
May 28, 2023 Edited by MARC Bot import existing book
December 23, 2020 Edited by MARC Bot import existing book
August 2, 2020 Created by ImportBot Imported from Better World Books record