An edition of Scanning Microscopies 2013
(2013)
Scanning Microscopies 2013
Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
by Michael Postek, Dale Newbury, S. Frank Platek, and Tim Maugel
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Scanning electron microscopesShowing 1 featured edition. View all 1 editions?
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Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
2013, SPIE
in English
0819495204 9780819495204
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- Created August 4, 2020
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| October 31, 2022 | Edited by ImportBot | import existing book |
| August 4, 2020 | Created by ImportBot | Imported from Better World Books record |