An edition of ESD (2005)

Esd

Failure Mechanisms and Models

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Esd
Steven H. Voldman, Steven H. V ...
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Last edited by ImportBot
August 21, 2020 | History
An edition of ESD (2005)

Esd

Failure Mechanisms and Models

  • 3 Want to read
  • 1 Currently reading

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena. ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD. With an emphasis on examples, this text: explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods; outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology; focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well a...

Publish Date
Language
English
Pages
408

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Previews available in: English

Edition Availability
Cover of: Esd
Esd: Failure Mechanisms and Models
2009, Wiley & Sons, Incorporated, John
in English
Cover of: ESD
ESD
2006, John Wiley & Sons, Ltd.
Electronic resource in English
Cover of: ESD
ESD: circuits and devices
2006, John Wiley, Wiley
in English

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Book Details


Classifications

Library of Congress
TK7871.852.V65 2009

ID Numbers

Open Library
OL29028382M
ISBN 13
9780470747261

Source records

Better World Books record

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August 21, 2020 Created by ImportBot Imported from Better World Books record