An edition of CMOS Gate-Stack Scaling Vol. 1155 (2014)

CMOS Gate-Stack Scaling Vol. 1155

Materials, Interfaces and Reliability Implications

by , , , , and

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CMOS Gate-Stack Scaling Vol. 1155
Alexander A. Demkov, Taylor, B ...
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Last edited by ImportBot
August 23, 2020 | History
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An edition of CMOS Gate-Stack Scaling Vol. 1155 (2014)

CMOS Gate-Stack Scaling Vol. 1155

Materials, Interfaces and Reliability Implications

by , , , , and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
University of Cambridge ESOL Examinations
Language
English
Pages
194

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Subjects
Metal oxide semiconductors, complementary, Silicides, Gate array circuits

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Cover of: CMOS Gate-Stack Scaling Vol. 1155
CMOS Gate-Stack Scaling Vol. 1155: Materials, Interfaces and Reliability Implications
2014, University of Cambridge ESOL Examinations
in English
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Library of Congress

ID Numbers

Open Library
OL29206002M
ISBN 13
9781107408326

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August 23, 2020 Created by ImportBot Imported from Better World Books record