An edition of Trace-Based Post-Silicon Validation for VLSI Circuits (2013)

Trace-Based Post-Silicon Validation for VLSI Circuits

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Cover of: Trace-Based Post-Silicon Validation for VLSI Circuits by Xiao Liu, Qiang Xu, Xiao Liu, Qiang Xu
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Last edited by ImportBot
August 26, 2020 | History
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An edition of Trace-Based Post-Silicon Validation for VLSI Circuits (2013)

Trace-Based Post-Silicon Validation for VLSI Circuits

by and

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Pages
126

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Subjects

Integrated circuits, very large scale integration
Edition Availability
Cover of: Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Aug 23, 2016, Springer
paperback
Libraries near you: WorldCat
Cover of: Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Jun 14, 2013, Springer
paperback
  • Not in Library
Libraries near you: WorldCat

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Book Details

The Physical Object

Format
paperback
Number of pages
126

ID Numbers

Open Library
OL29500643M
ISBN 10
3319005340
ISBN 13
9783319005348

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amazon.com record

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
August 26, 2020 Created by ImportBot Imported from amazon.com record