An edition of Focus on applied statistics (2003)

Focus on applied statistics

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Cover of: Focus on applied statistics by Mohammad Ahsanullah, editor.
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read
Notes

Check nearby libraries

Buy this book

Last edited by MARC Bot
January 8, 2023 | History
Edit
An edition of Focus on applied statistics (2003)

Focus on applied statistics

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Nova Science Publishers
Language
English
Pages
217

Check nearby libraries

Buy this book

Subjects
Statistics

Showing 1 featured edition. View all 1 editions?

Edition Availability
Cover of: Focus on applied statistics
Focus on applied statistics
2003, Nova Science Publishers
in English
  • Not in Library
Libraries near you: WorldCat

Add another edition?

Book Details

Table of Contents

A family of estimators for the coefficient of determination in linear regression models / Anil K. Srivastava and Shobhit
Regression versions of Lukacs type characterizations for the bivariate gamma distribution / Konstancja Bobecka / Testing for multiple change-points in an autoregressive model using SIC criterion / A.H. Al Ibrahim, M.A. Ahmed, and S.S. BuHamra
Simultaneous prediction in restricted regressiono models / M. Dube and Veena Manocha
Generalized negative binomial regression model / Felix Famoye and Edwin H. Kaufman, Jr.
OLS bias and MSE in the random walk model with a constant initial value / Albert K. Tsui and Mukhtar M. Ali
On the quasi-random sequences in the random processes modeling algorithms / Sergei Ermakov and Tatiana Tovstik
Locating a change point in a Gaussian model when an outlier is present / Jie Chen and N. Balakrishnan
Estimation of the smaller and larger of two exponential scale parameters / Alvard Y. Arazyan, Nabendu Pal and Wei-Hsiung Shen
Pitman nearness comparison of estimators of parameters of exponential distribution in the truncated space / N. Sanjari Farsipour
Classical and Bayesian reliability estimation of the negative binomial distribution / Ajit Chaturvedi and Sanjeev K. Tomer
A Bayesian analysis for correlated binary data in the presence of covariates / Jorge Alberto Achar and Vanderly Janeiro
The generalized multivariate modified Bessel distribution and its Bayesian applications / L. Thabane and M. Safiul Haq
A Bayesian design for the optimal allocation of binomaila samples / Athanassios Katsis and Blaza Toman
Shrinkage estimation of the exponential reliability with censored data / Ayman Baklizi
Optimal equivariant vector prediciton in location families / Martin L. William and T. M. Durairajan.

Edition Notes

Includes bibliographical references and index.

Published in
[Hauppauge] New York
Other Titles
Applied statistics

Classifications

Dewey Decimal Class
519.5
Library of Congress
QA276.A12 F63 2003, QA276.A12F63 2003

The Physical Object

Pagination
vi, 217 p. :
Number of pages
217

ID Numbers

Open Library
OL3325675M
ISBN 10
1590339118
LCCN
2004299232
OCLC/WorldCat
54403991
Goodreads
4728836

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
January 8, 2023 Edited by MARC Bot import existing book
June 17, 2022 Edited by ImportBot import existing book
December 8, 2020 Edited by MARC Bot import existing book
August 19, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record