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Machine vision and three-dimensional imaging systems for inspection and metrology II: 29-30 October 2001, Boston, [Massachusetts] USA
2002, SPIE
in English
081944295X 9780819442956
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Includes bibliographic references and author index.
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- Created April 1, 2008
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November 15, 2023 | Edited by MARC Bot | import existing book |
December 5, 2020 | Edited by MARC Bot | import existing book |
October 8, 2020 | Edited by ImportBot | import existing book |
July 31, 2020 | Edited by ImportBot | import existing book |
April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |