Machine vision and three-dimensional imaging systems for inspection and metrology II

29-30 October 2001, Boston, [Massachusetts] USA

Machine vision and three-dimensional imaging ...
Kevin G. Harding
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Last edited by MARC Bot
November 15, 2023 | History

Machine vision and three-dimensional imaging systems for inspection and metrology II

29-30 October 2001, Boston, [Massachusetts] USA

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Publish Date
Publisher
SPIE
Language
English
Pages
236

Buy this book

Book Details


Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Washington
Series
SPIE proceedings series ;, v. 4567, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4567.
Genre
Congresses.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TA1634 .M316 2002, TA1634.M316 2002

The Physical Object

Pagination
ix, 236 p. :
Number of pages
236

ID Numbers

Open Library
OL3584785M
ISBN 10
081944295X
LCCN
2002283059
OCLC/WorldCat
49535329
Goodreads
3508226

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History

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November 15, 2023 Edited by MARC Bot import existing book
December 5, 2020 Edited by MARC Bot import existing book
October 8, 2020 Edited by ImportBot import existing book
July 31, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record