An edition of Defect-oriented testing for nano-metric CMOS VLSI circuits (2007)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

by Manoj Sachdev and José Pineda de Gyvez

Defect-Oriented Testing for Nano-Metric CMOS ...

Manoj Sachdev, José Pineda de ...

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February 25, 2022 | History

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An edition of Defect-oriented testing for nano-metric CMOS VLSI circuits (2007)

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Publish Date

2007

Publisher

Springer London, Limited

Language

English

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Previews available in: English

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Edition	Availability
1 Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Nov 10, 2010, Springer paperback 1441942858 9781441942852	zzzz Not in Library Libraries near you: WorldCat
2 Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) June 21, 2007, Springer in English 0387465464 9780387465463	zzzz Not in Library Libraries near you: WorldCat
3 Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2007, Springer London, Limited in English 0387465472 9780387465470	aaaa Not in Library Libraries near you: WorldCat