An edition of Digital Noise Monitoring of Defect Origin (2007)

Digital Noise Monitoring of Defect Origin

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Digital Noise Monitoring of Defect Origin
Telman Aliev, Telman Aliev
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Last edited by ImportBot
February 26, 2022 | History
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An edition of Digital Noise Monitoring of Defect Origin (2007)

Digital Noise Monitoring of Defect Origin

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Publish Date
Publisher
Springer London, Limited
Language
English

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Subjects

Electronic noise, Information storage and retrieval systems, Numerical analysis

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Edition Availability
Cover of: Digital Noise Monitoring of Defect Origin
Digital Noise Monitoring of Defect Origin
2010, Springer
in English
Libraries near you: WorldCat
Cover of: Digital Noise Monitoring of Defect Origin
Digital Noise Monitoring of Defect Origin
2007, Springer London, Limited
in English
  • Not in Library
Libraries near you: WorldCat

Add another edition?

Book Details

Classifications

Library of Congress
TK5102.9

The Physical Object

Pagination
xii, 224

ID Numbers

Open Library
OL37112561M
ISBN 13
9780387717548

Source records

Better World Books record

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February 26, 2022 Created by ImportBot Imported from Better World Books record