Secondary Ion Mass Spectrometry SIMS II

Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford University, Stanford, California, USA August 27-31 1979

Secondary Ion Mass Spectrometry SIMS II
A. Benninghoven, C.A. Jr Evans ...
Locate

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today


Buy this book

Last edited by ImportBot
March 1, 2022 | History

Secondary Ion Mass Spectrometry SIMS II

Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford University, Stanford, California, USA August 27-31 1979

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Springer
Language
English

Buy this book

Book Details


Classifications

Library of Congress
QD96.M3

The Physical Object

Pagination
xiv, 300

ID Numbers

Open Library
OL37426823M
ISBN 13
9783642618710

Source records

Better World Books record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
March 1, 2022 Created by ImportBot Imported from Better World Books record