Method for measuring thickness of buildup area on unitized microfilm carriers (aperture, camera, copy, and image cards)

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Last edited by MARC Bot
December 8, 2022 | History

Method for measuring thickness of buildup area on unitized microfilm carriers (aperture, camera, copy, and image cards)

  • 0 Ratings
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Publish Date
Language
English

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Edition Availability
Cover of: Method for measuring thickness of buildup area on unitized microfilm carriers (aperture, camera, copy, and image cards)

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Book Details


Edition Notes

"ANSI/NMA MS9-1973 (R1977); approved September 5, 1973 and reaffirmed November 28, 1977, as an American National Standard."

Published in
Silver Spring, Md
Other Titles
Measuring thickness of buildup area of unitized microfilm carriers.
Copyright Date
1973

The Physical Object

Pagination
1 microfiche

ID Numbers

Open Library
OL43338739M
ISBN 10
0892580070
OCLC/WorldCat
80406903

Source records

marc_columbia MARC record

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Download catalog record: RDF / JSON / OPDS | Wikipedia citation
December 8, 2022 Created by MARC Bot Imported from marc_columbia MARC record