Check nearby libraries
Buy this book
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Showing 1 featured edition. View all 1 editions?
Edition | Availability |
---|---|
1
ARPA/NBS workshop III: test patterns for integrated circuits
1976, U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Edition Notes
Includes bibliographical references.
Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.
Classifications
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?History
- Created April 1, 2008
- 4 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
November 15, 2023 | Edited by MARC Bot | import existing book |
October 9, 2020 | Edited by MARC Bot | import existing book |
December 14, 2009 | Edited by WorkBot | link works |
April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |