Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
This edition doesn't have a description yet. Can you add one?
Publish Date
1980
Language
English
Check nearby libraries
Buy this book
![Loading indicator](/images/ajax-loader-bar.gif)
Subjects
Integrated circuits, Masks, Optical measurementsShowing 1 featured edition. View all 1 editions?
Edition | Availability |
---|---|
1
Accurate linewidth measurements on integrated-circuit photomasks
1980, Department of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
in English
|
aaaa
Libraries near you:
WorldCat
|
Book Details
Edition Notes
This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards.
Issued Feb. 1980.
CODEN: XNBSAV.
Includes bibliographical references.
ID Numbers
Community Reviews (0)
Feedback?History
- Created November 15, 2023
- 1 revision
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
November 15, 2023 | Created by MARC Bot | Imported from marc_columbia MARC record |