An edition of Testing to integrate semiconductor memories into computer mainframes (1973)

Testing to integrate semiconductor memories into computer mainframes

digest of papers ; Cherry Hill, New Jersey, October 4, 1972

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Last edited by MARC Bot
December 13, 2023 | History
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An edition of Testing to integrate semiconductor memories into computer mainframes (1973)

Testing to integrate semiconductor memories into computer mainframes

digest of papers ; Cherry Hill, New Jersey, October 4, 1972

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Institute of Electrical and Electronics Engineers
Language
English
Pages
96

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Subjects
Semiconductor storage devices, Testing, Congresses

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Edition Availability
Cover of: Testing to integrate semiconductor memories into computer mainframes
Testing to integrate semiconductor memories into computer mainframes: digest of papers ; Cherry Hill, New Jersey, October 4, 1972
1973, Institute of Electrical and Electronics Engineers
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

"72CHP810-2 C."

On spine: IEEE 1972 Semiconductor memories computer mainframes.

Published in
New York
Other Titles
IEEE 1972 Semiconductor memories computer mainframes., Semiconductor memories computer mainframes.

The Physical Object

Pagination
96 p.
Number of pages
96

ID Numbers

Open Library
OL50454198M
OCLC/WorldCat
3430598

Source records

harvard_bibliographic_metadata record

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December 13, 2023 Created by MARC Bot Imported from harvard_bibliographic_metadata record