An edition of Machine vision systems for inspection and metrology VIII (1999)

Machine vision systems for inspection and metrology VIII

21-22 September 1999, Boston, Massachusetts

by

Cover of: Machine vision systems for inspection and metrology VIII by Bruce G. Batchelor
Not in Library

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Last edited by MARC Bot
July 18, 2024 | History
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An edition of Machine vision systems for inspection and metrology VIII (1999)

Machine vision systems for inspection and metrology VIII

21-22 September 1999, Boston, Massachusetts

by

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Publish Date
Publisher
SPIE
Language
English
Pages
252

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Subjects

Computer vision, Congresses, Optical measurements, Engineering inspection, Industrial applications, Automation

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Edition Availability
Cover of: Machine vision systems for inspection and metrology VIII
Machine vision systems for inspection and metrology VIII: 21-22 September 1999, Boston, Massachusetts
1999, SPIE
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE ;, v. 3836, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3836.
Genre
Congresses.

Classifications

Dewey Decimal Class
670.42/5
Library of Congress
TA1634 .M3356 1999, TA1634.M3356 1999

The Physical Object

Pagination
vii, 252 p. :
Number of pages
252

ID Numbers

Open Library
OL6803717M
ISBN 10
0819434299
LCCN
00266009
OCLC/WorldCat
42709399
Goodreads
768850

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 18, 2024 Edited by MARC Bot import existing book
October 8, 2020 Edited by ImportBot import existing book
September 10, 2020 Edited by MARC Bot import existing book
July 31, 2020 Edited by ImportBot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record