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Subjects
Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Engineering measurement & calibration, Mathematics for scientists & engineers, Technology & Industrial Arts, Engineering Statistics, Very-Large-Scale Integration (Vlsi), Technology, Science/Mathematics, Electronics - Semiconductors, Mensuration, ReferenceEdition | Availability |
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1
Statistical Metrology, 1998 3rd Workshop
July 1998, Institute of Electrical & Electronics Enginee
Paperback
in English
0780343387 9780780343382
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2
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, IEEE, Widerkehr and Associates
in English
0780343387 9780780343382
|
aaaa
Libraries near you:
WorldCat
|
3
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, Widerkehr and Associates
Unknown Binding
in English
0780343395 9780780343399
|
zzzz
Libraries near you:
WorldCat
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Book Details
Edition Notes
Includes bibliographical references.
"IEEE Catalog Number 98EX113"--verso of T.p.
Classifications
The Physical Object
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- Created April 1, 2008
- 6 revisions
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July 17, 2024 | Edited by MARC Bot | import existing book |
November 26, 2020 | Edited by MARC Bot | import existing book |
April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
April 12, 2010 | Edited by bgimpertBot | Added goodreads ID. |
April 1, 2008 | Created by an anonymous user | Imported from Scriblio MARC record |