Check nearby libraries
Buy this book
This edition doesn't have a description yet. Can you add one?
Check nearby libraries
Buy this book
Subjects
Complementary Metal oxide semiconductors, Congresses, Defects, Iddq testing, Integrated circuits, Electronics engineering, Systems analysis & design, Systems management, Digital Computer Hardware, Metal oxide semiconductors, Complementary, Computers, Technology & Industrial Arts, Computer Books: General, General, Metal oxide semiconductors, Co, Computer Engineering, TestingShowing 2 featured editions. View all 2 editions?
Edition | Availability |
---|---|
1
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings
August 2000, Institute of Electrical & Electronics Enginee
Paperback
in English
0769506372 9780769506371
|
aaaa
Libraries near you:
WorldCat
|
2
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada : proceedings
2000, IEEE Computer Society
in English
0769506372 9780769506371
|
zzzz
Libraries near you:
WorldCat
|
Book Details
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?History
- Created April 29, 2008
- 5 revisions
Wikipedia citation
×CloseCopy and paste this code into your Wikipedia page. Need help?
July 31, 2019 | Edited by MARC Bot | associate edition with work OL7799246W |
April 24, 2010 | Edited by Open Library Bot | Fixed duplicate goodreads IDs. |
April 16, 2010 | Edited by bgimpertBot | Added goodreads ID. |
April 14, 2010 | Edited by Open Library Bot | Linked existing covers to the edition. |
April 29, 2008 | Created by an anonymous user | Imported from amazon.com record |