2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada

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Last edited by MARC Bot
July 31, 2019 | History

2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada

Proceedings

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Publish Date
Language
English
Pages
85

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Edition Availability
Cover of: 2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings
August 2000, Institute of Electrical & Electronics Enginee
Paperback in English
Cover of: 2000 IEEE International Workshop on Defect Based Testing

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Book Details


The Physical Object

Format
Paperback
Number of pages
85
Dimensions
10.5 x 8.2 x 0.2 inches
Weight
8.8 ounces

ID Numbers

Open Library
OL8067401M
ISBN 10
0769506372
ISBN 13
9780769506371
Goodreads
1374302

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
July 31, 2019 Edited by MARC Bot associate edition with work OL7799246W
April 24, 2010 Edited by Open Library Bot Fixed duplicate goodreads IDs.
April 16, 2010 Edited by bgimpertBot Added goodreads ID.
April 14, 2010 Edited by Open Library Bot Linked existing covers to the edition.
April 29, 2008 Created by an anonymous user Imported from amazon.com record