| Record ID | bcl_marc/bcl_open.03.mrc:137438626:1261 |
| Source | bcl_marc |
| Download Link | /show-records/bcl_marc/bcl_open.03.mrc:137438626:1261?format=raw |
LEADER: 01261nam 22003137a 4500
003 OCoLC
004 GPJ6873
005 20000524101700.0
008 930126s1992 ohu b f000 0 eng d
035 $a(OCoLC)ocm27318713
035 9 $aGPJ6873
037 $aN 92-25996$bNASA
040 $aDGPO$cDGPO$dDLC$dMvI
049 $aBXMX
074 $a0830-D (MF)
086 0 $aNAS 1.15:105577
100 1 $aBaaklini, George Y.
245 10 $aX-ray attenuation measurements for high-temperature materials characterization and in-situ monitoring of damage accumulation$h[microform] /$cGeorge Y. Baaklini.
260 $aCleveland, Ohio :$bNational Aeronautics and Space Administration, Lewis Research Center ;$a[Springfield, Va. :$bFor sale by the National Technical Information Service,$c1992]
300 $a1 v.
440 0 $aNASA technical memorandum ;$v105577
500 $aDistributed to depository libraries in microfiche.
500 $aShipping list no.: 92-2264-M.
533 $aMicrofiche.$b[Washington, D.C.? :$cNational Aeronautics and Space Administration],$d1992.$e3 microfiches.
650 0 $aComposite materials.
650 0 $aQuality control.
710 2 $aLewis Research Center.
852 30 $aMChB$bGOV$cFICHE$hNAS 1.15:105577$91
948 $aLTI 08/08/2000