| Record ID | bcl_marc/bcl_open.03.mrc:140248364:1527 |
| Source | bcl_marc |
| Download Link | /show-records/bcl_marc/bcl_open.03.mrc:140248364:1527?format=raw |
LEADER: 01527nam 2200397 a 4500
003 OCoLC
004 GPJ8940
005 20000524101700.0
007 he-bmb024bbca
008 930407s1991 mdua bbt f000 0 eng d
035 $a(OCoLC)ocm27869110
035 9 $aGPJ8940
037 $a003-003-03104-6$bGPO$fpaper copy
040 $aGPO$cGPO$dDLC$dMvI
043 $an-us---
049 $aBXMX
074 $a0249-A (MF)
086 0 $aC 13.46:1289
100 1 $aWagner, C. D.$q(Charles Daniel),$d1917-
245 14 $aThe NIST X-ray photoelectron spectroscopy (XPS) database$h[microform] /$cCharles D. Wagner.
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, National Institute of Standards and Technology,$c1991.
300 $aiii, 65 p. :$bill. ;$c28 cm.
440 0 $aNIST technical note ;$v1289
513 $aFinal.
500 $aPaper version no longer for sale by the Supt. of Docs.
500 $aDistributed to depository libraries in microfiche.
500 $aShipping list no.: 92-2029-M.
500 $a"October 1991."
504 $aIncludes bibliographical references.
533 $aMicrofiche.$b[Washington, D.C.?] :$cSupt. of Docs., U.S. G.P.O.,$d[1992]$e1 microfiche : negative.
610 20 $aNational Institute of Standards and Technology (U.S.)$vDatabases.
650 0 $aX-ray spectroscopy$vDatabases.
650 0 $aPhotoelectron spectroscopy$vDatabases.
710 2 $aNational Institute of Standards and Technology (U.S.)
852 30 $aMChB$bGOV$cFICHE$hC 13.46:1289$91
948 $aLTI 08/08/2000