| Record ID | harvard_bibliographic_metadata/ab.bib.00.20150123.full.mrc:438440814:1764 |
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LEADER: 01764cam a2200289uu 4500
001 000556261-9
005 20020606090541.3
008 780517s1978 maua 00010 eng
010 $a 77073950 //r90
020 $a0201011743
035 0 $aocm03672627
040 $aDLC$cDLC
050 00 $aQC482.D5$bC84 1978
082 00 $a543/.085
100 1 $aCullity, B. D.$q(Bernard Dennis)
245 10 $aElements of x-ray diffraction /$cB. D. Cullity.
250 $a2d ed.
260 0 $aReading, Mass. :$bAddison-Wesley Pub. Co.,$cc1978.
300 $axii, 555 p. :$bill. ;$c25 cm.
490 0 $aAddison-Wesley series in metallurgy and materials
505 0 $aFundamentals -- Properties of x-rays -- Geometry of crystals -- Diffraction I: direction of diffracted beams -- Diffraction II: intensities of diffracted beams -- Experimental methods -- Laue photographs -- Powder photographs -- Diffractometer and spectrometer measurements -- Applications -- Orientation and quality of single crystals -- Structure of polycrystalline aggregates -- Determination of crystal structure -- Precise parameter measurements -- Phase-diagram determination -- Order-disorder transformations -- Chemical analysis by X-ray diffraction -- Chemical analysis by X-ray spectrometry -- Measurement of residual stress.
504 $aIncludes bibliographical references and index.
650 0 $aX-rays$xDiffraction.
776 08 $iOnline version:$aCullity, B.D. (Bernard Dennis).$tElements of x-ray diffraction.$b2d ed.$dReading, Mass. : Addison-Wesley Pub. Co., ©1978$w(OCoLC)607263459
776 08 $iOnline version:$aCullity, B.D. (Bernard Dennis).$tElements of x-ray diffraction.$b2d ed.$dReading, Mass. : Addison-Wesley Pub. Co., ©1978$w(OCoLC)609213771
988 $a20020608
906 $0DLC