| Record ID | harvard_bibliographic_metadata/ab.bib.00.20150123.full.mrc:659008096:1150 |
| Source | harvard_bibliographic_metadata |
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LEADER: 01150cam a2200313Ii 4500
001 000800129-4
005 20020606090541.3
008 780822s1978 nyua b 00010 eng d
020 $a0387910689
035 0 $aocm04157416
040 $aYUS$cYUS
050 4 $aQC482.S6$bJ48 1978
100 1 $aJenkins, Ron,$d1932-
245 10 $aWorked examples in x-ray analysis /$cR. Jenkins, J. L. De Vries.
250 $a2d ed.
260 0 $aNew York :$bSpringer-Verlag,$c1978.
300 $a135, [4] p. (1 fold) :$bill. ;$c23 cm.
490 0 $aPhilips technical library
504 $aBibliography: p. 135.
505 0 $aSpectra -- Instrumentation -- Counting statistics -- Quantitative analysis -- Miscellaneous.
650 0 $aX-ray spectroscopy$xProblems, exercises, etc.
650 2 $aSpectrum Analysis.
650 2 $aX-Ray Diffraction.
655 7 $aProblems, exercises, etc.$2fast
700 1 $aVries, J. L. de.,$ejoint author.
700 1 $aVries, J. L. de,$eauthor.
776 08 $iOnline version:$aJenkins, Ron, 1932-$tWorked examples in x-ray analysis.$b2d ed.$dNew York : Springer-Verlag, 1978$w(OCoLC)701149938
988 $a20020608
906 $0OCLC