| Record ID | harvard_bibliographic_metadata/ab.bib.00.20150123.full.mrc:802895204:1227 |
| Source | harvard_bibliographic_metadata |
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LEADER: 01227cam a2200325 i 4500
001 000955765-2
005 20020606090541.3
008 750102s1975 nyua b 00110 eng
010 $a 74034162 //r922
020 $a0306308207
035 0 $aocm01174600
040 $aDLC$cDLC
050 00 $aQH212.S3$bG64
060 00 $aQH 212.S3$bP895 1975
082 00 $a502/.8
100 1 $aGoldstein, Joseph,$d1939-
245 10 $aPractical scanning electron microscopy :$belectron and ion microprobe analysis /$cedited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
260 0 $aNew York :$bPlenum Press,$c[1975]
300 $axviii, 582 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aScanning electron microscopes.
650 0 $aMicroprobe analysis.
650 0 $aScanning electron microscopy.
650 2 $aElectron Probe Microanalysis.
650 2 $aMicroscopy, Electron, Scanning.
700 1 $aYakowitz, Harvey,$d1939-
700 1 $aYakowitz, Harvey,$d1939-$eauthor.
776 08 $iOnline version:$aGoldstein, Joseph, 1939-$tPractical scanning electron microscopy.$dNew York : Plenum Press, [1975]$w(OCoLC)624777327
988 $a20020608
906 $0DLC