| Record ID | harvard_bibliographic_metadata/ab.bib.01.20150123.full.mrc:155833766:993 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.01.20150123.full.mrc:155833766:993?format=raw |
LEADER: 00993cam a2200289uu 4500
001 001165629-8
005 20131114021630.0
008 840706s1984 wb a b 00110 eng
010 $a 84013974
020 $a0387133593 (U.S.)
020 $a3540133593 (West Germany)
035 0 $aocm10995820
040 $aDLC$cDLC
100 1 $aWaseda, Yoshio.
245 10 $aNovel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials /$cYoshio Waseda.
246 3 $aAnomalous (resonance) X-ray scattering for structural characterization of disordered materials.
260 0 $aBerlin ;$aNew York :$bSpringer-Verlag,$c1984.
300 $avi, 183 p. :$bill. ;$c25 cm.
440 0 $aLecture notes in physics ;$v204
500 $aIncludes index.
504 $aBibliography: p. [170]-177.
650 0 $aX-rays$xScattering.
650 0 $aOrder-disorder models.
650 0 $aPhysics.
650 0 $aCrystallography.
988 $a20020608
906 $0DLC