| Record ID | harvard_bibliographic_metadata/ab.bib.10.20150123.full.mrc:16729921:871 |
| Source | harvard_bibliographic_metadata |
| Download Link | /show-records/harvard_bibliographic_metadata/ab.bib.10.20150123.full.mrc:16729921:871?format=raw |
LEADER: 00871nam a2200265 a 4500
001 010022759-7
005 20060719133719.0
008 060719s2006 nyua b 001|0 eng d
020 $a0387400907
024 3 $a9780387400907
035 0 $aocm70900496
050 00 $aQH212.S33$bF68 2006
090 $aQH212.S33$bF67 2006
100 1 $aFoster, A.$q(Adam)
245 10 $aScanning probe microscopy :$batomic scale engineering by forces and currents / A. Foster, W. Hofer.
246 30 $aAtomic scale engineering by forces and currents
260 $aNew York :$bSpringer,$cc2006.
300 $axiv, 281 p. :$bill. ;$c25 cm.
440 0 $aNanoscience and technology
504 $aIncludes bibliographical references and index.
650 0 $aScanning probe microscopy.
650 0 $aScanning electron microscopy.
700 1 $aHofer, W.$q(Werner)
988 $a20060719
906 $0MH